Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack

Publication information:

Vijay Reddi, Meeta Gupta, Michael Smith, Gu Wei, David Brooks, and Simone Campanoni. 2009. “Software-Assisted Hardware Reliability: Abstracting Circuit-Level Challenges to the Software Stack”. In Proceedings of the 46th Annual Design Automation Conference, Pp. 788–793. San Francisco, CA

Abstract

Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program's instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.