Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack

Publication information:

Vijay Reddi, Meeta Gupta, Michael Smith, Gu Wei, David Brooks, and Simone Campanoni. 2009. “Software-Assisted Hardware Reliability: Abstracting Circuit-Level Challenges to the Software Stack”. In 2009 46th ACM IEEE Design Automation Conference, Pp. 788–793. San Francisco, CA: IEEE

Abstract

Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program's instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60% of these events with minimal overhead, thereby significantly improving overall performance.