Predicting voltage droops using recurring program and microarchitectural event activity
Publication information:
Vijay Reddi, Meeta Gupta, Glenn Holloway, Michael Smith, Gu Wei, and David Brooks. 2010. “Predicting Voltage Droops Using Recurring Program and Microarchitectural Event Activity”. IEEE Micro, 30, 1
Abstract
Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.