Predicting voltage droops using recurring program and microarchitectural event activity

Citation:

Vijay Reddi, Meeta Gupta, Glenn Holloway, Michael Smith, Gu Wei, and David Brooks. 1/2010. “Predicting voltage droops using recurring program and microarchitectural event activity.” IEEE Micro, 30, 1. Publisher's Version

Abstract:

Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.
Last updated on 04/28/2022