TY - JOUR T1 - Cognitive computing safety: The new horizon for reliability JF - IEEE Micro Y1 - 2017 A1 - Yuhao Zhu A1 - Vijay Reddi AB - This column includes two invited position papers about the challenges and opportunities in cognitive architectures. VL - 37 UR - https://doi.org/10.1109/MM.2017.2 ER -