TY - CONF T1 - Understanding voltage variations in chip multiprocessors using a distributed power-delivery network T2 - Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE'07 Y1 - 2007 A1 - Meeta Gupta A1 - Jarod Oatley A1 - Russ Joseph A1 - Gu Wei A1 - David Brooks AB - Recent efforts to address microprocessor power dissipation through aggressive supply voltage scaling and power management require that designers be increasingly cognizant of power supply variations. These variations, primarily due to fast changes in supply current, can be attributed to architectural gating events that reduce power dissipation. In order to study this problem, the authors propose a fine-grain, parameterizable model for power-delivery networks that allows system designers to study localized, on-chip supply fluctuations in high-performance microprocessors. Using this model, the authors analyze voltage variations in the context of next-generation chip-multiprocessor (CMP) architectures using both real applications and synthetic current traces. They find that the activity of distinct cores in CMPs present several new design challenges when considering power supply noise, and they describe potentially problematic activity sequences that are unique to CMP architectures JF - Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE'07 PB - IEEE CY - Nice, France UR - https://doi.org/10.1109/DATE.2007.364663 ER -