@conference {reddi2009software,
	title = {Software-assisted hardware reliability: abstracting circuit-level challenges to the software stack},
	booktitle = {2009 46th ACM/IEEE Design Automation Conference},
	year = {2009},
	pages = {788{\textendash}793},
	publisher = {IEEE},
	organization = {IEEE},
	address = {San Francisco, CA},
	abstract = {Power constrained designs are becoming increasingly sensitive to supply voltage noise. We propose a hardware-software collaborative approach to enable aggressive operating margins: a checkpoint-recovery mechanism corrects margin violations, while a run-time software layer reschedules the program{\textquoteright}s instruction stream to prevent recurring margin crossings at the same program location. The run-time layer removes 60\% of these events with minimal overhead, thereby significantly improving overall performance.},
	url = {https://doi.org/10.1145/1629911.1630114},
	author = {Vijay Reddi and Meeta Gupta and Michael  Smith and Gu  Wei and David Brooks and Simone Campanoni}
}
