@article {reddi2010predicting,
	title = {Predicting voltage droops using recurring program and microarchitectural event activity},
	journal = {IEEE Micro},
	volume = {30},
	year = {2010},
	publisher = {IEEE},
	abstract = {Shrinking feature size and diminishing supply voltage are making circuits more sensitive to supply voltage fluctuations within a microprocessor. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues. A mechanism that dynamically learns to predict dangerous voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger.},
	keywords = {voltage-noise},
	url = {https://doi.org/10.1109/MM.2010.25},
	author = {Vijay Reddi and Meeta Gupta and Glenn Holloway and Michael  Smith and Gu  Wei and David Brooks}
}
