Characterizing and Evaluating Voltage Noise in Multi-Core Near-Threshold Processors


Xuan Zhang, Tao Tong, Svilen Kanev, Sae Lee, Gu Wei, and David Brooks. 9/4/2013. “Characterizing and Evaluating Voltage Noise in Multi-Core Near-Threshold Processors.” In International Symposium on Low Power Electronics and Design (ISLPED). Publisher's Version


Lowering the supply voltage to improve energy efficiency leads to higher load current and elevated supply sensitivity. In this paper, we provide the first quantitative analysis of voltage noise in multi-core near-threshold processors in a future 10nm technology across SPEC CPU2006 benchmarks. Our results reveal larger guardband requirement and significant energy efficiency loss due to power delivery nonidealities at near threshold, and highlight the importance of accurate voltage noise characterization for design exploration of energy-centric computing systems using near-threshold cores.
Last updated on 04/26/2022