Citation:Jayanth Srinivasan, Sarita Adve, Pradip Bose, Jude Rivers, Y. Li, David Brooks, Z Hu, K Skadron, V Srinivasan, and M Gschwind. 2005. “The case for microarchitectural awareness of lifetime reliability.” IEEE Micro, 25, 3, Pp. 70–80.Download CitationBibTeX RTF Tagged EndNote XML RIS Last updated on 11/04/2020 RTFRIS